SB-850 Seebeck and Electrical Resistivity Test Device

With the increasing global energy demand and the worsening environmental issues, thermoelectric materials—functional materials that can directly convert thermal energy into electrical energy—have attracted widespread attention. Accurate measurement of the thermoelectric properties of materials is fundamental for further research on thermoelectric materials and the development of high-efficiency thermoelectric conversion devices.

Thermoelectric properties are mainly determined by three basic parameters:

  • Seebeck coefficient (S)
  • Electrical conductivity (σ)
  • Thermal conductivity (κ)

The thermoelectric figure of merit ZT = S²σκT comprehensively reflects the thermoelectric conversion efficiency of a material. Therefore, accurate determination of these parameters is essential for evaluating the thermoelectric performance of materials.
The thermoelectric performance testing device allows evaluation of the thermoelectric performance of metals or semiconductor materials.


Technical Specifications:

  1. Temperature range: RT up to 850 ℃
  2. Temperature resolution: 0.001 ℃
  3. Temperature control accuracy: ±0.25 K
  4. Constant current source: 0.000–220 mA
    • Resolution: 100 nA
    • Stability: 0.008 + 20 nA/day
    • Standard configuration includes advanced imported Keithley commercial data acquisition unit
    • Keithley technology highlights:
      • 100 nV RMS noise background
      • DC voltage sensitivity as low as 10 nV
      • Basic accuracy: ±0.002 % (90 days)
      • DCV repeatability: 7 ppm
      • 1-year basic DCV accuracy: ±0.0028 %
      • Max. reading speed: 2000 readings/sec
  5. Measurement range:
    • Seebeck coefficient: 0.5 μV/K – 25 V/K
    • Resistivity: 0.2 μΩ·mm – 2.5 kΩ·mm
  6. (Repeated) Temperature resolution: 0.001 ℃
  7. Measurement resolution:
    • AC voltage: 0.1 μV
    • Resistance: 1 μΩ
    • Current: 1 nA
    • Automatic U-I curve scanning calculates optimal current value and enables accurate conductivity measurement
  8. Accuracy:
    • Seebeck coefficient: ±7 %
    • Electrical conductivity: ±10 %
    • Repeatability: ±3 %
  9. Sample reference size: 4×4×20 mm to 8×8×30 mm

Device Configuration:

  1. Test mainframe (horizontal structure)
  2. Environmental heating furnace (2 kW / 850 ℃)
  3. Measurement bracket (4 electrodes, 2 temperature difference probes, adjustable electrodes, includes auxiliary heating)
  4. Vacuum cover and protective cover
  5. Test software
  6. User manual


Other Related Products

HFM50/300 Thermal Conductivity Tester
Read More
LFA 1000 Laser Flash Thermal Conductivity &Diffusivity Tester
Read More
HFM1600 High Temperature Thermal Conductivity Tester
Read More
Tuber 100 High Temperature Electrical Resistivity Tester
Read More
THS 200 Thermal Conductivity Tester
Read More
TPS 500 Thermal Conductivity Tester (Transient Plane Heat Source)
Read More

Technical Parameters

Icon

Sample Testing

Icon

2 Years Quality Guarantee

Icon

On-Site Commissioning

Icon

After-Sales Maintenance